au.\*:("IBACH, W")
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Characterization of thin polymer films on the nanometer scale with confocal Raman AFMSCHMIDT, U; HILD, S; IBACH, W et al.Macromolecular symposia. 2005, pp 133-143, issn 1022-1360, isbn 3-527-31333-8, 1Vol, 11 p.Conference Paper
The confocal Raman AFM : A powerful tool for the characterization of surface coatingsSCHMIDT, U; IBACH, W; MUELLER, J et al.Proceedings of SPIE, the International Society for Optical Engineering. 2007, pp 66160E.1-66160E.6, issn 0277-786X, isbn 978-0-8194-6758-4, 2VolConference Paper